- 产品详情
- 产品参数
【技术参数】
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型号 | ASYELEC.01-R2 |
制造厂商 | Asylum Research |
探针描述 | 硅基探针；Ti/Ir反射层；针尖镀Ti/Ir |
类型 | 电学模式 |
应用 | 导电模式,静电力模式,表面电势模式,扫描电容模式,压电力模式;CAFM; EFM;KPFM; SCM; PFM |
【产品详情】
| Lever | 1 | 2 | 3 | 4 |
Spring k (N/m) | 2.8 (1.4 - 5.8) | - | - | - | |
Freq (kHz) | 75 (58 - 97) | - | - | - | |
Length (µm) | 240 (233 - 245) | - | - | - | |
Width (µm) | 35 (30 - 40) | - | - | - | |
Thickness (µm) | 3.0 (2.5 - 3.5) | - | - | - | |
Shape | rectangular | - | - | - | |
Material | Silicon | - | - | - | |
Reflex Coating (nm) | Ti/Ir (5/20) | - | - | - | |
针尖描述 | ||
| Tip radius (nm) | 25 |
Tip height (µm) | 12.5 +/- 2.5 | |
Front angle (°) | 20 +/- 1 | |
Back angle (°) | 35 +/- 1 | |
Side angle (°) | 30 +/- 1 | |
Tip shape | 3-sided | |
Tip material | Silicon | |
Tip coating (nm) | Ti/Ir (5/20) | |
DESCRIPTION
f = 75 kHz | k = 2.8 N/m | tip coating: Ti/Ir
New and improved version of Asylum exclusive conductive probes with optimized iridium coated tip and lever for high resolution nanoelectrical measurements with outstanding wear resistance.
Asylum electrolevers are are ideal choice for several electrical applications such as conducting scanning probe microscopy (c-AFM) in air, electric force microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and Scanning Spreading Resistance Microscopy (SSRM) with an unprecedented combination of sharpness and long tip life time as a metal coated probe.
Asylum electrolevers provide:
1) Long life time: Optimized iridium coating shows longer tip life time compared to other metal coated probes while maintains high electrical conductivity for electric measurements requiring high electro-potential resolution.
2) High resolution: Thin and sharp tetrahedral tip structure combined with thin metal coating makes the electrolever prominently sharp among metal-coated probes. This probe resolves sample structures precisely both electrically and topographically.
3) Visible apex tip: Fine structure of interest can be pointed accurately by electrolever using the optical microscopy as the tetrahedral tip is positioned on the very end of the cantilever, and it is not blocked by the body of the cantilever.